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Derniers dépôts
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Nombre de documents
82
Nombre de notices
294
Mots-clés
NEXAFS
Atomic force microscopy
Optical properties
Sputtering
AlN
Band alignment
C Photoelectron spectroscopy
Magnetron sputtering
Thin film
AZO thin films
Carbon
Ablation laser
Buffer Couple
Biofilms microbiens
Bipolar resistive switching BRS
B2 Semiconducting indium compounds
Alzheimer's disease
Anatase
Titanium dioxide
CIGSe
Rutile
Transmission electron microscopy
Transfert d'énergie
BOMBARDMENT
Avalanche breakdown
3 nm in size
Mott insulators
Atomic layer etching
Mott insulator
Bixbyite
B Chemical synthesis
Integrated optics
Spectroscopic ellipsometry
Biomembranes
A1 Characterization
B3 Solar cells
Optical interferometry
Semiconductors
CH4
Adsorption
CNTs’ collapse
TEM
Low-pressure plasma processing
Residual stress
Films
XPS
B1 Inorganic compounds
Oxides
CaTiO3Pr^3^+
Thin films
Kirkendall effect
Chalcogenide
Amyloid precursor
Vanadium Sesquioxide
Selenization
X-ray diffraction
Carbon Nanotube
Functionalization
Nanocomposite
PECVD
A Multilayers
A-CNx
Etching
Amorphous
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
Scanning electron microscopy
AuCu alloy
Aryl-diazonium salts
Calcined clay
Optical waveguides
Aluminium nitride
Physical vapor deposition
Copper
Annealing
Biocapteurs
V2O3
Mass spectrometry
Applications industrielles
Resistive switching
TiO2
Plasma etching
A3 Physical vapor deposition processes
A Chalcogenides
Sol-gel
CHLORINE PLASMAS
X-ray photoelectron spectroscopy
B2 Quaternary
Plasmas froids
Nanotubes
Structure
SF 6
Band gap
Alloying
Non-volatile memory
Ambipolar material
Colloidal solution
Capacitance
B2 Semiconducting alloys
Biomasse
A Thin films