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Transmission electron microscopy characterization of low temperature boron doped silicon epitaxial films

Guillaume Noircler , Marta Chrostowski , Melvyn Larranaga , Etienne Drahi , Pere Roca I Cabarrocas , et al.
CrystEngComm, 2020, 22 (33), pp.5464-5472. ⟨10.1039/D0CE00817F⟩
Journal articles hal-03030275v1